Frontiers in electronics : future chips : proceedings of the 2002 Workshop on Frontiers in Electronics (WOFE-02), St Croix, Virgin Islands, USA, 6-11 January 2002
The 2002 Workshop on Frontiers in Electronics was the third in the series of WOFE workshops. Over 70 leading experts from academia, industry, and government agencies reported on the most recent developments in their fields and exchanged views on future trends and directions of the electronics and photonics industry. The issues they addressed ranged from system-on-chip to DNA doping, from ultrathin SOI to electrotextiles, from photonics integration on the ULSI platform to wide band gap semiconductor devices and solid state lighting. The rapid pace of electronic technology evolution compels a merger of different technical areas, and WOFE-02 provided a unique opportunity for cross-fertilization of the emerging fields of microelectronics, photonics, and nanoelectronics. The workshop was informal and stimulated provocative views, visionary outlooks, and discussions on controversial issues
Conference papers and proceedings
1 online resource (xii, 345 pages) : illustrations (some color)
9789812796912, 9812796916
1086443978
Plenary talk. Optical wave propagation in periodic structures / A. Yariv and S. Mookherjea
MEMS technology for advanced telecommunication applications / H.-G. Lee [and others]
Low temperature ohysics at room temperature in water: charge inversion in chemical and biological systems / A. Yu. Grosberg, T.T. Nguyen, and B.I. Shklovskii
Ultra large scale electronics (ULSI). MOSFET and front-end process integration: scaling trends, challenges, and potential solutions through the end of the roadmap / P.M. Zeitzoff [and others]
Issues, achievements and challenges towards integration of high-k dielectrics / M. Caymax [and others]
Materials for strained silicon devices / P.M. Mooney
Recent progress of ferroelectric memories / H. Ishiwara
System-on-chip integration / R.R. Doering
Ultra-thin SOI transistors for ultimate CMOS technology: fundamental properties and application perspectives / D. Esseni [and others]
Far-future trends in SOI technology: a guess / S. Cristoloveanu
Nanoelectronics. Nanoelectronics: some current aspects and prospects / R. Hull, R. Martel, and J.M. Xu
Electrotextiles. Electrotextiles / E. Ethridge and D. Urban
Semiconductor thin films and thin films devices for electrotextiles / M. Shur, S.L. Rumyantsev, and R. Gaska
Electrotextiles: concepts and challenges / S. Wagner [and others]
Wide band gap materials and devices. Strain energy band engineering approach to AIN/GaN/InN heterojunction devices / A. Khan [and others]
Semiconductor UV sources and detectors: some non-consumer applications / E. Muñoz
Optimization of white all-semiconductor lamp for solid-state lighting applications / A. Zukauskas [and others]
System impact of silicon carbide power devices / B. Ozpineci [and others]
Low frequency noise in gallium nitride field effect transistors / S.L. Rumyantsev [and others]
Hot-phonon limited electron energy relaxation in AIN/GaN / A. Matulionis [and others]. Terahertz electronics and applications. Polar-optical phonon enhancement of harmonic generation in Schottky diodes / B. Gelmont, D. Woolard, and S. Chen
Environmental sensing of chemical and biological warfare agents in the THz region / A.C. Samuels [and others]
THz detection by resonant 2-D plasmons in field effect devices / X. Peralta [and others] and W. Knap [and others]
Advanced concepts. Thermal management in optoelectronics / D.K. Johnstone
The multiple-gate MOS-JFET transistor / B.J. Blalock [and others]
Architecture and design of an 8-bit FLUX-1 superconductor RSFQ microprocessor / M. Dorojevets
Sensing applications. Noise measurement of III-V compound detectors for 2 [symbol] Lidar/DIAL remote sensing applications / M.N. Abedin, T.F. Refaat, and U.N. Singh
Spectral response measurements of short wave infrared detectors (SWIR) / T.F. Refaat, M.N. Abedin, and U.N. Singh
Modeling and simulation. Numerical analysis of random dopant-induced effects in semiconductor devices / I.D. Mayergoyz and P. Andrei
A simulation-based preview of extremely scaled double-gate CMOS devices and circuits / J.G. Fossum
Full-chip power-supply noise: the effect of on-chip power-rail inductance / C.W. Fok and D.L. Pulfrey
Quantum dot superlattices in a constant electric field: localization and Bloch oscillations / R.A. Suris and I.A. Dmitriev
www.worldscientific.com Click for access to ebook